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Annual Meeting of American Crystallographic Association
New Orleans, Louisiana
May 26 - 30, 2017
Special Session: Going Beyond PX with Cryo Electron Microscopy, Tomography, and Diffraction
Abstract Deadline: Feb. 15, 2017
Registration Deadline: March 31, 2017
Conference information: http://www.amercrystalassn.org/2017-meeting-homepage